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Triple-frequency intermittent contact atomic force microscopy characterization: Simultaneous topographical, phase, and frequency shift contrast in ambient air
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10.1063/1.3475644
/content/aip/journal/jap/108/5/10.1063/1.3475644
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/5/10.1063/1.3475644
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/content/aip/journal/jap/108/5/10.1063/1.3475644
2010-09-02
2014-07-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Triple-frequency intermittent contact atomic force microscopy characterization: Simultaneous topographical, phase, and frequency shift contrast in ambient air
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/5/10.1063/1.3475644
10.1063/1.3475644
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