SEM picture (a) and x-ray diffraction patterns (b) of the as-grown sample. The red rectangle marks the position where we took the EDX spectrum. (c) The EDX spectrum taken from one piece of the sample.
Temperature dependence of resistivity, the arrow shows the temperature of structure phase transition. The left inset shows resistivity and the curve at low temperature regime. The right inset shows the dc susceptibility as a function of temperature in a field of 50 Oe. The arrows in both insets show the onset transition temperature.
Magnetic susceptibility (main panel) and normalized resistivity (inset) as a function of temperature for the as-grown and annealed sample.
Temperature dependence of the electrical resistivity in dc magnetic fields up to 9 T. The inset displays the temperature dependence of resistive upper critical field at three defined temperatures.
Fluctuation conductivity as a function of in a log-log scale. The solid lines represent the 3D (yellow) and 2D (green) AL behavior, respectively. For the 3D paraconductivity a coherence length has been used while for the 2D case the structural distance between layers has been inserted. The insets show the layered structure of FeSe and 1111-phase superconductors.
Article metrics loading...
Full text loading...