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Reversible room temperature ferromagnetism in undoped zinc oxide: Correlation between defects and physical properties
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10.1063/1.3491037
/content/aip/journal/jap/108/7/10.1063/1.3491037
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/7/10.1063/1.3491037

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of ZnO films grown at different substrate temperatures on -sapphire substrate.

Image of FIG. 2.
FIG. 2.

ZnO (002) peak position of the films annealed in oxygen atmosphere at different temperatures.

Image of FIG. 3.
FIG. 3.

Fourier filtered HRTEM image of as-grown ZnO (tilted to zone) showing highly epitaxial film on sapphire with an atomically sharp interface. Inset shows the selected area diffraction pattern of film-substrate interface.

Image of FIG. 4.
FIG. 4.

(a) XPS high-resolution scan of oxygen peak for as-grown ZnO. Inset shows its SIMS depth profile of Co, Si, Mn, Fe, and Ni impurities. (b) Oxygen peak of oxygen-annealed samples. Inset shows the EELS spectra of as-grown ZnO film described in (a). XPS data has been fitted by Gaussian functions.

Image of FIG. 5.
FIG. 5.

(a) Carrier concentrations and resistivity of ZnO films annealed at different temperatures in 760 Torr oxygen atmosphere. (b) represents the “on” and “off” states of the samples.

Image of FIG. 6.
FIG. 6.

(a) RT PL spectra of ZnO films grown at different oxygen partial pressures . (b) PL spectra of as-grown, oxygen-annealed, and further vacuum annealed samples.

Image of FIG. 7.
FIG. 7.

M-H plot of as-grown and oxygen-annealed (at 760 Torr) samples at different temperatures.

Image of FIG. 8.
FIG. 8.

(a) RT hysteresis loops of as-grown, oxygen annealed, and oxygen annealed followed by vacuum annealed ZnO films. (b) “on” and “off” magnetic states of the samples.

Image of FIG. 9.
FIG. 9.

Experimental X-band EPR spectra ( and -axis) of ZnO films grown and treated under the conditions listed in the Table III. (a) As-grown, (b) annealed in the presence of oxygen, (c) annealed in the presence of oxygen followed by vacuum annealing, and (d) experimental (black) and least-square fit (red) spectra of as-grown ZnO shown in (a). The insets in (b) and (c) show, respectively, the forbidden and transitions. The least-squares fit has been carried out using EWVOIGT program (Ref. 20) with the following best-fit parameters: Lorentzian line shape with and .

Tables

Generic image for table
Table I.

Carrier concentrations, resistivity, mobility, and RT saturation moments of ZnO films grown at different substrate temperatures under pressure and different oxygen partial pressures at .

Generic image for table
Table II.

Temperature dependent saturation moments and carrier concentrations of ZnO thin films.

Generic image for table
Table III.

The best fit parameters for the EPR spectra of as-grown and annealed ZnO films. The isotropic -factor, , is calculated as .

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/content/aip/journal/jap/108/7/10.1063/1.3491037
2010-10-06
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reversible room temperature ferromagnetism in undoped zinc oxide: Correlation between defects and physical properties
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/7/10.1063/1.3491037
10.1063/1.3491037
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