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Electron relaxation in empty quantum-well states of a Pb island on Cu(111) studied by Z-V (distance-voltage) spectroscopy in scanning tunneling microscopy
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10.1063/1.3483241
/content/aip/journal/jap/108/8/10.1063/1.3483241
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/8/10.1063/1.3483241
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Figures

Image of FIG. 1.
FIG. 1.

(a) The growth of Pb islands on Cu(111) surface at room temperature at the coverage of 2.1 ML. The image size is . (b) spectrum acquired on the island of 27-layer thickness. The numbers marked close to the peaks denote the order of a QW state. (c) Energy separation of adjacent peaks as function of the order.

Image of FIG. 2.
FIG. 2.

(a) The spectrum in Fig. 1(a) is analyzed by using the fitting of a series of Lorentzian peaks for extracting the linewidth of each peak of QW state. (b) The extracted linewidth as function of peak energy.

Image of FIG. 3.
FIG. 3.

(a) dZ/dV-V spectra of thickness range from five to eight atomic layers and Lorentzian fittings. (b) Extracted linewidths of peaks of all spectra in (a) vs peak energy.

Image of FIG. 4.
FIG. 4.

(a) The extracted linewidths in Fig. 2(b) are fitted by the Fermi-liquid theory combining with the Fabry–Pérot modes to obtain the intrinsic linewidths as marked by triangles (STA method). The crosses mark the intrinsic linewidths obtained by the MTA method. (b) The energy dependences of the product of electron reflectivities at the interface and surface obtained by the STA and MTA.

Image of FIG. 5.
FIG. 5.

(a) spectrum acquired on the island of 21-layer thickness. (b) The extracted linewidths in (a) are fit to obtain the intrinsic linewidths (STA). The crosses mark the intrinsic linewidths obtained by the MTA method. (c) The energy dependences of the product of electron reflectivities obtained by the STA and MTA.

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/content/aip/journal/jap/108/8/10.1063/1.3483241
2010-10-19
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron relaxation in empty quantum-well states of a Pb island on Cu(111) studied by Z-V (distance-voltage) spectroscopy in scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/108/8/10.1063/1.3483241
10.1063/1.3483241
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