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Solution-processed ZnO nanocrystals in thin-film light-emitting diodes for printed electronics
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View: Figures


Image of FIG. 1.
FIG. 1.

Schematic illustration of a thin-film LED composed with a ZnO NC EML and a pentacene HTL.

Image of FIG. 2.
FIG. 2.

Typical FESEM surface image of ZnO NC layer printed on a quartz substrate.

Image of FIG. 3.
FIG. 3.

XRD pattern of a commercial wurtzite ZnO powder (a) and those of the ZnO NC powders as a function of (b). XRD patterns are offset for clarity.

Image of FIG. 4.
FIG. 4.

Time evolutions of crystal size: the average crystal radius cubed of ZnO NCs plotted vs . The solid and dashed lines show the fit of the results to Eq. (2).

Image of FIG. 5.
FIG. 5.

PL spectra of the ZnO NCs as a function of (a) and PL peak intensities of UV (●) and green (◆) bands, respectively, plotted vs (b).

Image of FIG. 6.
FIG. 6.

PL peak energies of exciton emission (●) plotted as a function of . Those reported in Ref. 30 are also plotted (◼).

Image of FIG. 7.
FIG. 7.

characteristics of thin-film LEDs using ZnO NC EMLs with different (8 nm: ●, 9 nm: ◆, and 11 nm: ▲) (a) and its expanded plot in light-emitting region (b). The inset in (a) shows EL intensities plotted vs as a function of (8 nm: ●, 9 nm: ◆, and 11 nm: ▲). Solid lines in (a) represents asymptotic lines to the power laws.

Image of FIG. 8.
FIG. 8.

Optical transmittance spectrum of a pentacene HTL deposited on a quartz substrate (a) and EL spectra of thin-film LEDs with ZnO NC EMLs with different (b) [8 nm (top), 9 nm (middle), and 11 nm (bottom)]. The spectra are offset for clarity. The EL spectra were measured near their maximum intensities as shown in the inset of Fig. 7(a).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Solution-processed ZnO nanocrystals in thin-film light-emitting diodes for printed electronics