Experimental setup for thin films deposition by TVA method.
Photos of the droplets on glass sample.
Diagram of the SFE values obtained by Owens–Wendt method.
Diagram of the SFE values (Wu equation of state method).
TEM image of the film.
Grain size distribution (Feret's diameter histogram).
Diffraction pattern of the film.
Profile from SAED image.
The parameters for thin films synthesis.
Values of contact angle on different substrates.
Results obtained for thickness and refractive index.
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