Grazing incidence XRD diffractograms of Ti–Al–C films deposited on (a) (0001) oriented , (b) oriented , (c) oriented . The source of the background peak in (c) was the sample mounting adhesive; this was verified with a separate background scan (not shown).
geometry XRD diffractograms of Ti–Al–C films deposited on (a) (0001) oriented , (b) oriented , (c) oriented .
Pole figures of the sample grown on the substrate, plotted over the (radial) range in equal-area Schmidt projection, with a logarithmic intensity scale. (a) shows a pole figure of the (0006) and planes. The inset shows a separate higher-resolution scan of the main peaks. (b) shows a pole figure of the plane. The dashed curves overlaid are the patterns expected from the proposed tilted fiber texture, calculated from the geometry of the unit cell and the location of the (0006) pole.
(a) A cross-sectional TEM image of a Ti–Al–C film grown on oriented , showing the film morphology. The regions of the sample shown in (c) and (d), and Fig. 5(a) are marked. (b) An AFM topographic map of the sample on . (c) A map of the Ti:Al ratio of a selected area of the film, as measured by EDX. (d) A map of the C:Ti ratio of the same area, measured by EELS. In (c) and (d), warmer colors indicate higher values.
A high magnification image of the substrate/film interface region of the sample. [(b)–(d)] The FFTs of the substrate and the two film regions of Fig. 4(a).
Cross-sectional TEM images of a Ti–Al–C film deposited on oriented .
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