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Dielectric dispersion of thin film from centimeter to submillimeter wavelengths
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10.1063/1.3531534
/content/aip/journal/jap/109/1/10.1063/1.3531534
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/1/10.1063/1.3531534

Figures

Image of FIG. 1.
FIG. 1.

CPW and IDC structures for de-embedding techniques (a), optical view of an IDC (b), and RLC equivalent circuit (c).

Image of FIG. 2.
FIG. 2.

Capacitance and factor of the IDC measured with M (diamond points) and Y (triangular points) de-embedding techniques, and modeled by Cole–Cole function (solid line).

Image of FIG. 3.
FIG. 3.

Mapping of current densities around an IDC at 15 (a) and 180 GHz (b).

Image of FIG. 4.
FIG. 4.

Complex permittivity as a function of frequency modeled by Cole–Cole function (solid lines) and measured by TDS (triangular points).

Image of FIG. 5.
FIG. 5.

Log-log representation of factor vs capacitance with frequency as a parameter, and measured at room temperature. The inset shows an expanded representation at 30 GHz.

Image of FIG. 6.
FIG. 6.

Capacitance-voltage characteristic measured at 50 GHz and at room temperature. The inset shows the inverse of permittivity as a function of temperature.

Tables

Generic image for table
Table I.

Parameter values for dielectric dispersion by dipole polarization and elements of the equivalent circuit of IDC.

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/content/aip/journal/jap/109/1/10.1063/1.3531534
2011-01-14
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dielectric dispersion of BaSrTiO3 thin film from centimeter to submillimeter wavelengths
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/1/10.1063/1.3531534
10.1063/1.3531534
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