CPW and IDC structures for de-embedding techniques (a), optical view of an IDC (b), and RLC equivalent circuit (c).
Capacitance and factor of the IDC measured with M (diamond points) and Y (triangular points) de-embedding techniques, and modeled by Cole–Cole function (solid line).
Mapping of current densities around an IDC at 15 (a) and 180 GHz (b).
Complex permittivity as a function of frequency modeled by Cole–Cole function (solid lines) and measured by TDS (triangular points).
Log-log representation of factor vs capacitance with frequency as a parameter, and measured at room temperature. The inset shows an expanded representation at 30 GHz.
Capacitance-voltage characteristic measured at 50 GHz and at room temperature. The inset shows the inverse of permittivity as a function of temperature.
Parameter values for dielectric dispersion by dipole polarization and elements of the equivalent circuit of IDC.
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