RHEED images of (a) UHV annealed MgO (100) substrate and (b) after 5 nm growth on MgO substrate. The images were recorded in (100) azimuth. PIMM data (c), (d) (black dots) and VNA-FMR data (e), (f) of 15 and 65 nm thick films. Red lines are fits to the data by an exponentially damped sinusoid (c), (d) and a Lorentzian (e), (f), respectively.
(a) Field dependence of the resonance frequency of 15 nm (dots) and 65 nm (triangles) thick films. Field is applied along . Solid line is a fit to the dispersion relation. (b) Field dependence of effective damping parameter . (d) Sketch of angular coordinates used in model and experiment. (d) Dependence of and on in-plane field angle at . Blue line is a fit to .
Thickness dependence of the measured effective damping parameter by PIMM (black squares) and VNA-FMR (open dots) by considering saturation magnetization from Table I. Red solid line is a second order polynomial fit. Open triangles show the calculated thickness dependence of by considering non linear spin wave excitation.
Anisotropies and saturation magnetization extracted from fitting the field and angular dependence of derived from time and frequency domain data. Also derived from SQUID measurements is shown.
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