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Determination of activation behavior in annealed Al–N codoped ZnO Films
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10.1063/1.3587164
/content/aip/journal/jap/109/10/10.1063/1.3587164
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/10/10.1063/1.3587164

Figures

Image of FIG. 1.
FIG. 1.

(a) Carrier concentration as a function of reciprocal temperature (the Arrhenius plot used to derive the ionization energy is shown in the inset) and (b) RTPL spectrum for the undoped ZnO film annealed under ambient vacuum.

Image of FIG. 2.
FIG. 2.

Carrier concentration as a function of reciprocal temperature for the Al–N codoped ZnO film annealed under ambient vacuum (the Arrhenius plot used to derive the ionization energy is shown in the inset).

Image of FIG. 3.
FIG. 3.

Carrier concentration as a function of reciprocal temperature for the Al–N codoped ZnO film annealed under ambient nitrogen (the Arrhenius plot used to derive the ionization energy is shown in the inset).

Image of FIG. 4.
FIG. 4.

RTPL spectra of the (a) as-deposited, (b) vacuum-annealed, and (c) nitrogen-annealed Al–N codoped ZnO films.

Image of FIG. 5.
FIG. 5.

Schematic diagram of the postulated DAP transition involving the extrinsic NO and AlZn impurities. CB: conduction band. VB: valence band.

Image of FIG. 6.
FIG. 6.

25 K-measured LTPL spectra of the (a) vacuum-annealed and (b) nitrogen-annealed Al–N codoped ZnO films.

Image of FIG. 7.
FIG. 7.

UV-luminescence of the (a) vacuum-annealed Al–N codoped ZnO film and (b) nitrogen-annealed Al–N codoped ZnO film as a function of the measurement temperature.

Image of FIG. 8.
FIG. 8.

Emission intensity of the acceptor bound exciton (A0X) line in the nitrogen-annealed Al–N codoped ZnO film as a function of the reciprocal temperature.

Tables

Generic image for table
Table I.

Electrical properties of the as-deposited, vacuum-annealed, and nitrogen-annealed undoped and Al–N codoped ZnO films.

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/content/aip/journal/jap/109/10/10.1063/1.3587164
2011-05-16
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of activation behavior in annealed Al–N codoped ZnO Films
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/10/10.1063/1.3587164
10.1063/1.3587164
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