(Color online) Typical DLTS spectra of Bridgman-grown detector-grade crystals (a) CdZnTe:In and (b) CdMnTe:In.
(Color online) PL spectra of CMT, CMT:In, and CZT:In crystals between 0.5- and 1.7-eV. Indium-doped CMT and CZT crystals exhibit very strong A-center peaks and donor-bound exciton () peaks, which are typical properties of doped materials.
Typical SWXBT image of (a) CMT:In and (b) commercial CZT samples. There are many subgrain/low angle grain boundaries (SBs), TI (tellurium inclusions) induced defects, and screw dislocations (SDs).
SEM image of a chemically etched CZT sample. The density of dislocations is very high around Te inclusions, compared to areas of the matrix that are free from them.
Proposed model of trap levels in CMT:In material.
Summary of PL emission band at 4.2 K in CMT, CMT:In, and CZT:In samples.
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