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Epitaxy, strain, and composition effects on metal-insulator transition characteristics of SmNiO3 thin films
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10.1063/1.3598055
/content/aip/journal/jap/109/12/10.1063/1.3598055
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/12/10.1063/1.3598055
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Representative 2θ−ω scans of SNO films on (a) LAO, (b) SLAO, and (c) STO substrates, and (d) A typical pole figure measured on the SNO 112 reflection at 2θ = 33°.

Image of FIG. 2.
FIG. 2.

Representative 2θ−ω scans of SNO films on (a) sapphire and (b) Si substrate.

Image of FIG. 3.
FIG. 3.

Plan view TEM studies of as-deposited SNO film on Si substrate: (a) selected area diffraction pattern and (b) lattice image recorded from the film confirm the SNO phase.

Image of FIG. 4.
FIG. 4.

(Color online) Ni 2p 3/2 XPS spectra of SNO films on (a) LAO, (b) SLAO, and (c) STO substrates. The peaks associated with Ni, Ni2+, and Ni3+ are indicated.

Image of FIG. 5.
FIG. 5.

(Color online) Ni 2p 3/2 XPS spectra of SNO films on (a) Si and (b) sapphire substrates. The peaks associated with Ni and Ni2+ are indicated.

Image of FIG. 6.
FIG. 6.

(Color online) R-T measurements of SNO films on (a) LAO, SLAO and STO and (b) sapphire and Si substrates. Inset shows the dR/dT vs temperature for SNO films on (a) LAO and (b) Si substrates in order to determine the TMIT, which is defined as when the derivative crosses zero.

Image of FIG. 7.
FIG. 7.

(Color online) Reciprocal space mapping of the 103 asymmetric reflection of (a) 80 nm and (b) 200 nm SNO/LAO.

Image of FIG. 8.
FIG. 8.

(Color online) Ni 2p 3/2 XPS spectra of 200 nm SNO/LAO.

Image of FIG. 9.
FIG. 9.

(Color online) R-T measurement of 200 nm SNO/LAO. Inset shows the dR/dT vs temperature in order to determine the TMIT.

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/content/aip/journal/jap/109/12/10.1063/1.3598055
2011-06-23
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Epitaxy, strain, and composition effects on metal-insulator transition characteristics of SmNiO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/12/10.1063/1.3598055
10.1063/1.3598055
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