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Magnetoresistance in nanostructured Tb/Ti and Tb/Si multilayers
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10.1063/1.3544043
/content/aip/journal/jap/109/2/10.1063/1.3544043
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/2/10.1063/1.3544043
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Temperature dependencies of magnetization and electrical resistivity for the bulk polycrystalline Tb sample. An applied magnetic field is equal to 100 Oe.

Image of FIG. 2.
FIG. 2.

VSM hysteresis loops measured at different temperatures for the bulk polycrystalline Tb sample.

Image of FIG. 3.
FIG. 3.

MR curves measured at different temperatures for the bulk polycrystalline Tb sample. Left column—measurements in the longitudinal configuration, right column—measurements in the transverse configuration.

Image of FIG. 4.
FIG. 4.

Field dependence of the resistivity at 250 K at low fields measured in the longitudinal configuration for the bulk Tb sample. The solid line is the fit according to Eq. (1) using the experimental magnetization data plotted in Fig. 2.

Image of FIG. 5.
FIG. 5.

MR curves for and multilayers with different measured in the longitudinal (◼,▲) and transverse (◻, △) configurations. The data corresponding to the points (◼,◻) were measured at . For data corresponding to the points (▲, △) the temperatures are shown near the curves. The magnetic ordering temperature is also shown for each multilayered structure.

Image of FIG. 6.
FIG. 6.

curves measured at for the (a), (b), and the (c) multilayers.

Image of FIG. 7.
FIG. 7.

HRTEM bright field image (a) and energy-filtered TEM image of Tb, where the bright areas indicate the presence of Tb (b) for the sample.

Image of FIG. 8.
FIG. 8.

Normalized MR (open symbols) measured in the longitudinal configuration and magnetization square (full symbols) as a function of magnetic field for the (a) and (b) samples. is a proportionality constant.

Image of FIG. 9.
FIG. 9.

curves measured at 5 and 50 K for the sample.

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/content/aip/journal/jap/109/2/10.1063/1.3544043
2011-01-20
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Magnetoresistance in nanostructured Tb/Ti and Tb/Si multilayers
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/2/10.1063/1.3544043
10.1063/1.3544043
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