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Electronic structure analysis of threading screw dislocations in 4H–SiC using electron holography
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10.1063/1.3544066
/content/aip/journal/jap/109/3/10.1063/1.3544066
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/3/10.1063/1.3544066
/content/aip/journal/jap/109/3/10.1063/1.3544066
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/content/aip/journal/jap/109/3/10.1063/1.3544066
2011-02-08
2014-09-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electronic structure analysis of threading screw dislocations in 4H–SiC using electron holography
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/3/10.1063/1.3544066
10.1063/1.3544066
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