XRD patterns of pure samples sintered at different temperatures .
XRD patterns of nano-Cu doped samples sintered at different temperatures .
(a) Variations in FWHM of (100), (101), (002), and (110) peaks of pure and doped samples (b) Lattice strain calculated from the Williamson–Hall plot of all samples at different processing temperatures.
SEM images of the fractured surfaces of pure sample heat treated at 600 (a) and (b), and Cu doped samples heat treated at 550 (c), 575 (d), 600 (e), and (f).
Temperature dependence of resistance for pure sample processed at and Cu added sample at .
Variation in transport self-field critical current with sintering temperatures at 30 K of pure and Cu doped MgB2 samples.
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