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Double hysteresis loop induced by defect dipoles in ferroelectric Pb(Zr0.8Ti0.2)O3 thin films
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10.1063/1.3549116
/content/aip/journal/jap/109/4/10.1063/1.3549116
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/4/10.1063/1.3549116
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) XRD pattern of the PZT thin films annealed under pure oxygen (* Pyrochlore).

Image of FIG. 2.
FIG. 2.

(Color online) P-E curves of the PZT thin films naturally cooling from 650 °C with different applied fields.

Image of FIG. 3.
FIG. 3.

(Color online) P-E curves of the PZT thin films naturally cooling from 650 °C. Points A and C mark the saturated loop at positive field and negative field, respectively. Point B is the location on the hysteresis loop where E′ DDs (the static built-in field) inhibits polarization switching.

Image of FIG. 4.
FIG. 4.

(Color online) P-E curves of the PZT thin films naturally cooling from 650 °C and annealed under pure oxygen. E″ DDs was the static built-in field after the DDs were decreased and diffused in the direction of Ps.

Image of FIG. 5.
FIG. 5.

(Color online) The diffuse direction of oxygen vacancies through the lattices of oxygen octahedron in three stages (unannealed, annealed, aged).

Image of FIG. 6.
FIG. 6.

(Color online) P-E curves of the PZT thin films annealed under pure oxygen with different applied fields.

Image of FIG. 7.
FIG. 7.

(Color online) P-E curves of the PZT thin films aged at 80 °C under air atmosphere with different applied fields.

Image of FIG. 8.
FIG. 8.

(Color online) Capacitance–voltage curves of the PZT thin films naturally cooling from 650 °C, measured at different frequencies of 1, 10, and 100 kHz. The dielectric constant, calculated by using the classic formula for parallel-plate capacitors, is also shown in this figure.

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/content/aip/journal/jap/109/4/10.1063/1.3549116
2011-02-28
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Double hysteresis loop induced by defect dipoles in ferroelectric Pb(Zr0.8Ti0.2)O3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/4/10.1063/1.3549116
10.1063/1.3549116
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