(Color online) (a) The Kretschmann configuration for coupling the incident p-wave to the surface plasma wave on gold. (b) Simulation of angle-dependent reflectivity for various gold thicknesses. The abscissa specifies the incident angle from prism to metal. The inset shows the dependence of the minimum in reflectivity on the thickness of gold.
(Color online) Configuration for coupling the incident p-wave to the surface plasma wave on TiN.
(Color online) (a) Real (ɛ′) and imaginary (ɛ″) parts of dielectric functions for TiN (solid curves) and Au (dashed curves). Points represent fitting parameters used in simulating measured angle-dependent reflectivity. (b) Simulation of angle-dependent reflectivity for various TiN thicknesses. The abscissa represents the incident angle from the prism to TiN. The inset shows the dependence of the minimum in reflectivity on the TiN thickness.
(Color online) Schematic setup for measuring angle-dependent reflectivity.
(Color online) Angle-dependent reflectivity of TiN samples. (a) Samples with different TiN thicknesses obtained at an incident wavelength of 658 nm. (b) Sample with 45 nm-thick TiN obtained at different incident wavelengths. Points and curves plot measured and simulated data, respectively.
(Color online) (a) Experiments and (b) simulations of wavelength-dependent reflectivity of the 35 nm-thick TiN sample at various incident angles.
(Color online) Schematic charge distribution in the TiN layer.
(Color online) Dispersion relations of the surface plasma wave between TiN and air. The curve shows the theoretical result while the circles and squares plot experimental results for the 35 nm-thick TiN sample, obtained from wavelength-dependent reflectivity and from angle-dependent reflectivity, respectively.
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