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Structural templating and growth behavior of copper phthalocyanine thin films deposited on a polycrystalline perylenetetracarboxylic dianhydride layer
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10.1063/1.3553884
/content/aip/journal/jap/109/6/10.1063/1.3553884
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/6/10.1063/1.3553884
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Cross-sectional SEM image of the PTCDA (70 nm)/CuPc (386 nm) heterolayer thin film. The interface between the two molecular films, indicated by an arrow, is clearly distinguished.

Image of FIG. 2.
FIG. 2.

(Color online) Powder XRD data of the PTCDA thin films with a thickness, D, of (a) 70 nm, (b) 110 nm, and (c) the CuPc thin film with D of 31 nm. Molecular structures of PTCDA and CuPc are drawn above the diffraction patterns.

Image of FIG. 3.
FIG. 3.

(Color online) (a) UV-Vis. and (b) FTIR spectra for PTCDA thin films with a thickness, D, of 70 and 110 nm.

Image of FIG. 4.
FIG. 4.

(Color online) Powder XRD data of the CuPc thin films with a thickness, D, of (a) 79, (b) 115, (c) 205, and (d) 386 nm, deposited on a PTCDA layer with D of 70 nm.

Image of FIG. 5.
FIG. 5.

(Color online) Schematics of the templated growth of CuPc crystallites on PTCDA (a) (102) and (b) (110) planes.

Image of FIG. 6.
FIG. 6.

(Color online) Representative AFM images for CuPc thin films grown on glass substrates (a)–(c) and on 70 nm thick PTCDA thin films (d)–(f). The thickness of the CuPc films are (a) 63 nm, (b) 89 nm, (c) 168 nm, (d) 79 nm, (e) 115 nm, and (f) 205 nm.

Image of FIG. 7.
FIG. 7.

(Color online) Plots of surface RMS roughness, σ, as a function of CuPc film thickness, D. The thickness of the PTCDA layer in the PTCDA/CuPc heterolayer films (♦) was fixed at 70 nm.

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/content/aip/journal/jap/109/6/10.1063/1.3553884
2011-03-17
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural templating and growth behavior of copper phthalocyanine thin films deposited on a polycrystalline perylenetetracarboxylic dianhydride layer
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/6/10.1063/1.3553884
10.1063/1.3553884
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