Cross-sectional SEM image of the PTCDA (70 nm)/CuPc (386 nm) heterolayer thin film. The interface between the two molecular films, indicated by an arrow, is clearly distinguished.
(Color online) Powder XRD data of the PTCDA thin films with a thickness, D, of (a) 70 nm, (b) 110 nm, and (c) the CuPc thin film with D of 31 nm. Molecular structures of PTCDA and CuPc are drawn above the diffraction patterns.
(Color online) (a) UV-Vis. and (b) FTIR spectra for PTCDA thin films with a thickness, D, of 70 and 110 nm.
(Color online) Powder XRD data of the CuPc thin films with a thickness, D, of (a) 79, (b) 115, (c) 205, and (d) 386 nm, deposited on a PTCDA layer with D of 70 nm.
(Color online) Schematics of the templated growth of CuPc crystallites on PTCDA (a) (102) and (b) (110) planes.
(Color online) Representative AFM images for CuPc thin films grown on glass substrates (a)–(c) and on 70 nm thick PTCDA thin films (d)–(f). The thickness of the CuPc films are (a) 63 nm, (b) 89 nm, (c) 168 nm, (d) 79 nm, (e) 115 nm, and (f) 205 nm.
(Color online) Plots of surface RMS roughness, σ, as a function of CuPc film thickness, D. The thickness of the PTCDA layer in the PTCDA/CuPc heterolayer films (♦) was fixed at 70 nm.
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