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Electron and hole drift velocity in chemical vapor deposition diamond
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1.
1. H. Pernegger, S. Roe, P. Weilhammer, V. Eremin, H. Frais-Kolbl, E. Griesmayer, H. Ka-gan, S. Schnetzer, R. Stone, W. Trischuk, D. Twitchen, and A. Whitehead, J. Appl. Phys. 97, 073704 (2005).
http://dx.doi.org/10.1063/1.1863417
2.
2. M. Pomorski, E. Berdermann, M. Ciobanu, A. Martemyianov, P. Moritz, M. Rebisz, and B. Marczewska, Phys. Status Solidi A 202, 2199 (2005).
http://dx.doi.org/10.1002/pssa.v202:11
3.
3. M. Pomorski, E. Berdermann, A. Caragheorgheopol, M. Ciobanu, M. Kiscaron, A. Marte-myianov, C. Nebel, and P. Moritz, Phys. Status Solidi A 203, 3152 (2006).
http://dx.doi.org/10.1002/pssa.200671127
4.
4. C. Canali, E. Gatti, S. Kozlov, P. Manfredi, C. Manfredotti, F. Nava, and A. Quirini, Nucl. Instrum. Methods. 160, 73 (1979).
http://dx.doi.org/10.1016/0029-554X(79)90167-8
5.
5. A. A. Quaranta, C. Canali, and G. Ottaviani, Rev. Sci. Instrum. 41, 1205 (1970).
http://dx.doi.org/10.1063/1.1684761
6.
6. L. S. Pan, S. Han, D. R. Kania, S. Zhao, K. K. Gan, H. Kagan, R. Kass, R. Malchow, F. Morrow, W. F. Palmer, C. White, S. K. Kim, F. Sannes, S. Schnetzer, R. Stone, G. B. Thomson, Y. Sugimoto, A. Fry, S. Kanda, S. Olsen, M. Franklin, J. W. Ager III, and P. Pianetta, J. Appl. Phys. 74, 1086 (1993).
http://dx.doi.org/10.1063/1.354957
7.
7. M. Gabrysch, E. Marklund, J. Hajdu, D. J. Twitchen, J. Rudati, A. M. Lindenberg, C. Caleman, R. W. Falcone, T. Tschentscher, K. Moffat, P. H. Bucksbaum, J. Als-Nielsen, A. J. Nelson, D. P. Siddons, P. J. Emma, P. Krejcik, H. Schlarb, J. Arthur, S. Brennan, J. Hastings, and J. Isberg, J. Appl. Phys. 103, 064909 (2008).
http://dx.doi.org/10.1063/1.2890158
8.
8. C. E. Nebel, J. Münz, M. Stutzmann, R. Zachai, and H. Güttler, Phys. Rev. B 55, 9786 (1997).
http://dx.doi.org/10.1103/PhysRevB.55.9786
9.
9. J. Isberg, J. Hammersberg, E. Johansson, T. Wikstrom, D. J. Twitchen, A. J. Whitehead, S. E. Coe, and G. A. Scarsbrook, Science 297, 1670 (2002).
http://dx.doi.org/10.1126/science.1074374
10.
10. J. Isberg, M. Gabrysch, A. Tajani, and D. J. Twitchen, Semicond. Sci. Technol. 21, 1193 (2006).
http://dx.doi.org/10.1088/0268-1242/21/8/035
11.
11. M. Nesladek, A. Bogdan, W. Deferme, N. Tranchant, and P. Bergonzo, Diamond Relat. Mater. 17, 1235 (2008).
http://dx.doi.org/10.1016/j.diamond.2008.03.015
12.
12. F. Nava, C. Canali, M. Artuso, E. Gatti, P. F. Manfredi, and S. F. Kozlov, IEEE Trans. Nucl. Sci. 26, 308 (1979).
http://dx.doi.org/10.1109/TNS.1979.4329650
13.
13. F. Nava, C. Canali, C. Jacoboni, L. Reggiani, and S. F. Kozlov, Solid State Commun. 33, 475 (1980).
http://dx.doi.org/10.1016/0038-1098(80)90447-0
14.
14. L. Reggiani, S. Bosi, C. Canali, F. Nava, and S. F. Kozlov, Phys. Rev. B 23, 3050 (1981).
http://dx.doi.org/10.1103/PhysRevB.23.3050
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Figures

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FIG. 1.

Schematic of the ToF setup. The sample is illuminated with 3 ns (FWHM) 213 nm UV light from a quintupled Nd-YAG laser.

Image of FIG. 2.

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FIG. 2.

(Color online) Drift velocities for electrons and holes in the temperature range 83–460 K.

Image of FIG. 3.

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FIG. 3.

(Color online) Low field drift mobilities for electrons (circles) and holes (squares) in the temperature range 83–460 K. Data are based on (weighted) least-square fits. The dashed line was reprinted with permission from Reggiani , Phys. Rev. B , 3050 (1981). (Copyright 1981 by the American Physical Society.)

Tables

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Table I.

Overview of the three samples selected for this study.

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/content/aip/journal/jap/109/6/10.1063/1.3554721
2011-03-24
2014-04-16

Abstract

The time-of-flight technique has been used to measure the drift velocities for electrons and holes in high-purity single-crystalline CVD diamond. Measurements were made in the temperature interval K and for electric fields between and V/cm, applied in the crystallographic direction. The study includes low-field drift mobilities and is performed in the low-injection regime to perturb the applied electric field only minimally.

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Scitation: Electron and hole drift velocity in chemical vapor deposition diamond
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/6/10.1063/1.3554721
10.1063/1.3554721
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