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Electron and hole drift velocity in chemical vapor deposition diamond
1. H. Pernegger, S. Roe, P. Weilhammer, V. Eremin, H. Frais-Kolbl, E. Griesmayer, H. Ka-gan, S. Schnetzer, R. Stone, W. Trischuk, D. Twitchen, and A. Whitehead, J. Appl. Phys. 97, 073704 (2005).
3. M. Pomorski, E. Berdermann, A. Caragheorgheopol, M. Ciobanu, M. Kiscaron, A. Marte-myianov, C. Nebel, and P. Moritz, Phys. Status Solidi A 203, 3152 (2006).
6. L. S. Pan, S. Han, D. R. Kania, S. Zhao, K. K. Gan, H. Kagan, R. Kass, R. Malchow, F. Morrow, W. F. Palmer, C. White, S. K. Kim, F. Sannes, S. Schnetzer, R. Stone, G. B. Thomson, Y. Sugimoto, A. Fry, S. Kanda, S. Olsen, M. Franklin, J. W. Ager III, and P. Pianetta, J. Appl. Phys. 74, 1086 (1993).
7. M. Gabrysch, E. Marklund, J. Hajdu, D. J. Twitchen, J. Rudati, A. M. Lindenberg, C. Caleman, R. W. Falcone, T. Tschentscher, K. Moffat, P. H. Bucksbaum, J. Als-Nielsen, A. J. Nelson, D. P. Siddons, P. J. Emma, P. Krejcik, H. Schlarb, J. Arthur, S. Brennan, J. Hastings, and J. Isberg, J. Appl. Phys. 103, 064909 (2008).
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The time-of-flight technique has been used to measure the drift velocities for electrons and holes in high-purity single-crystalline CVD diamond. Measurements were made in the temperature interval K and for electric fields between and V/cm, applied in the crystallographic direction. The study includes low-field drift mobilities and is performed in the low-injection regime to perturb the applied electric field only minimally.
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