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Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy
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10.1063/1.3551733
/content/aip/journal/jap/109/7/10.1063/1.3551733
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/7/10.1063/1.3551733
/content/aip/journal/jap/109/7/10.1063/1.3551733
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/content/aip/journal/jap/109/7/10.1063/1.3551733
2011-04-05
2014-12-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/7/10.1063/1.3551733
10.1063/1.3551733
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