LEED images showing a) the complex GaAs surface reconstruction, b) epitaxial Fe and c) Au growth.
(Color online) a) Photograph of device showing Fe contacts, insulating film and contact pads. b) Device configuration for I-V 1 and B-V 2 measurements.
(Color online) TEM images showing a) as deposited and b) post-annealed Fe/GaAs films. The high resolution transmission electron microscopy (HRTEM) image c) shows the annealed interface, with d) showing the proposed interfacial structure.
(Color online) Comparison between our observation and previous studies in terms of surface reconstructions, annealing conditions and interfacial surfaces.
(Color online) Temperature dependence of the B-V characteristics, after subtraction of the background.
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