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(Color online) (Top) Specular neutron reflectivity data measured at 10 K in a 0.2 T in-plane magnetic field for the sample: Ni80Fe20(10 nm)/LiF(2 nm)/Alq3(100 nm)/LiF(2 nm)/Co(4 nm)/Al(10 nm)/Si(100) where the film thickness in parentheses represents the QCM value. (Middle) Nuclear scattering length density profile as a function from the distance to the surface obtained from the fitting procedure. (Bottom) Magnetic scattering length density profile obtained from the fitting procedure.
(Color online) Ultraviolet photoelectron spectra for (b) 0.5-, (c) 1-, and (d) 2-nm-thick LiF films deposited onto a 5 nm Ni80Fe20 film shown in (a).
(Color online) Ultraviolet photoelectron spectra for (a) 20 nm Alq3 film and (b) 1 nm LiF film on Alq3. The spectra labeled (c), (d), (e), and (f) show 0.2, 0.5, 1 and 4 nm Co films subsequently deposited onto the 1 nm LiF/20 nm Alq3 bilayer.
(Color online) X-ray absorption spectra in the fluorine K-edge region for a 2 nm LiF layer grown on a 20 nm Alq3 film (bottom) and a 3 nm Co layer deposited onto the 2 nm LiF/20 nm Alq3 film (top).
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