(Color online) Sketch of a one-dimensional MPC–a working pixel of e-MOSLM.
Calculated reflectivity (solid line) and a spectrum of the rotation angle (dashed line) for the sample of AR coating/SGGG/(Ta2O5/SiO2)9/Bi:YIG/PLZT/(SiO2/Ta2O5)18 at normal incidence.
Reflection and rotation angle spectra of the sample for light with the right- (solid line) and left-circular (dashed line) polarizations; a modeling incoming radiation had a wavelength of 780 nm.
Reflectivity (squares) and rotation angle (triangles) versus parameter f in the structure of AR coating/SGGG/(Ta2O5/SiO2) f /Bi:YIG/PLZT/(SiO2/Ta2O5)18.
Calculated reflectivity (solid line) and magnitude of the rotation angle (dashed line) versus applied voltage for the structure of the sample; a simulating wavelength was 780 nm.
Article metrics loading...
Full text loading...