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(Color online) XRR data with fits (—) for as-grown (□) and annealed Pt/Co/AlO x . The annealing temperature T Ann is 300 °C (○), and 450 °C (Δ), and the oxidation time t Ox is 15 s (a) and 55 s (b). The signals are shifted in the y direction.
(Color online) Thicknesses (Th) and roughness (rms) vs T Ann for each layer [CoO (a), AlO x (b), Co (c), and Al (d)] of Pt/Co/AlO x oxidized during 15 s and 55 s (as noted in the curves).
Mass densities vs T Ann for each layer [CoO (a), AlO x (b), and Co (c)] of Pt/Co/AlO x oxidized during 15 and 55 s. Expected bulk values are added in straight lines.
(Color online) Normalized Hall resistance EHE vs the magnetic field for Pt/Co/AlO x oxidized for t Ox = 15 s [(a) and (b)], and 55 s [(c) and (d)], and annealed at different T Ann. The measurement temperature = 300 K [(a) and (c)] and T = 5 K [(b) and (d)]. Note the different x scale between (a) and (b) and between (c) and (d).
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