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Omnidirectional reflectance and vanishing Brewster angle of disordered semiconductor nanopillar surface with gradually changed refractive index
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10.1063/1.3561491
/content/aip/journal/jap/109/8/10.1063/1.3561491
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/8/10.1063/1.3561491
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) The SEM images of Si nanopillars with different length.

Image of FIG. 2.
FIG. 2.

(Color online) (a) The angular dependent reflectance spectra at 532 nm and (b) nanopillar height dependent Brewster angle shift phenomenon at different laser wavelengths.

Image of FIG. 3.
FIG. 3.

(Color online) The reflectance spectra and the simulation results by the graded changed refractive index model.

Image of FIG. 4.
FIG. 4.

(Color online) The reflectance of Si nanopillars surface under n s/n 0 variations. (a) n s variation and (b) n 0 variation.

Image of FIG. 5.
FIG. 5.

(Color online) Simulation results of Si nanopillar surface with multilayered structure in (a) linear scale and (b) log scale by Rsoft diffraction model.

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/content/aip/journal/jap/109/8/10.1063/1.3561491
2011-04-21
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Omnidirectional reflectance and vanishing Brewster angle of disordered semiconductor nanopillar surface with gradually changed refractive index
http://aip.metastore.ingenta.com/content/aip/journal/jap/109/8/10.1063/1.3561491
10.1063/1.3561491
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