(a) XRD scan of the as-deposited epitaxial Mg film with Pd capping layer. In addition to the peaks from Mg, Pd, and the Al2O3 substrate, small peaks from the Al sample holder (S.H.) appear due to the large beam size. The inset shows a rocking curve of the Mg(0002) peak (FWHM ∼0.6°) demonstrating the highly aligned texture of the film. (b) A phi scan of the Mg (10 1) peaks (FWHM ∼7°), which show the biaxial texture of the Mg layer.
(Color online) Neutron reflectivity data (points) plus best fits to the data (lines) for the sample under the five conditions as indicated. For the third desorption, both the best fit (dashed line) and an alternate fit with 2 layers of MgHx (solid line) are shown. Additional data were taken that showed no features and were not displayed.
(Color online) Scattering length density as a function of distance from the substrate from the best fits for the five conditions of the sample. Two fits are included for the 3rd desorption, the best fit and a fit to a model with two MgH x layers.
(Color online) Fitted thicknesses (solid lines) and scattering length densities, SLD, (dotted lines) for the five sample conditions. The lines are drawn to guide the eye.
SEM cross-sectional image of the sample after the final desorption and after stepped ion-milling (as depicted in the inset) to expose the film surface. The image is taken with a 52° tilt from vertical to provide perspective on the vertically etched film surface.
Fitted SLD and thickness and calculated component volume fractions for each sample condition.
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