(Color online) RBS spectra for the as-prepared Au/ZnO samples.
(Color online) (a) X-Ray reflectometry for as deposited multilayers; (b) X-Ray reflectometry for annealed multilayers.
TEM cross-section view for (a) ZnO[Au(3.6)/ZnO]20 and (b), (c), and (d) ZnO[Au(1.8)/ZnO]75.
(Color online) Horizontal cuts of GISAXS patterns for ZnO[Au(2.4)/ZnO]40 (open square) and ZnO[Au(1.8)/ZnO]75 (black dots).
(Color online) (a) X-ray diffractograms for as prepared samples and a ZnO film; note the different vertical scales: log. scale for ZnO[Au(t)/ZnO] n on the left vertical axis, linear scale for ZnO on the right vertical axis; (b) X-ray diffractogram fit for ZnO[Au(7.8)/ZnO]5; (c) Integrated intensity of the Au(111) Bragg peak versus the total Au thickness; and (d) X-ray diffractogram for annealed ZnO[Au(1.8)/ZnO]75.
(Color online) Experimental and fitted IR spectra for pure ZnO and for as prepared and annealed ZnO[Au(3.6)/ZnO]20 and ZnO[Au(1.8)/ZnO]75.
(Color online) (a) Optical responses for ZnO[Au(3.6)/ZnO]20 and ZnO[Au(1.8)/ZnO]75 as prepared and after annealing, for pure ZnO and fused silica. Inset: absorption for ZnO[Au(1.8)/ZnO]75 in the 250–500 nm range, (b) Tauc plots for pure ZnO and ann.-ZnO[Au(1.8)/ZnO]75.
Characteristics of the prepared ZnO[Au(tAu)/ZnO] samples with the bilayer thickness determined by XRR ( XRR) and by RBS ( RBS), the number of Au atoms per layer, the Au layer thickness, the total number of Zn atoms and the ZnO thickness determined by RBS.
Structural parameters determined from the analysis of the GISAXS data. a
Interpretation of the XRD peaks.
Parameters for the dielectric functions. a
Article metrics loading...
Full text loading...