Volume 109, Issue 9, 01 May 2011
Index of content:
Cross-plane thermal diffusivity measurement of an operating vertical cavity surface emitting laser using thermoreflectance109(2011); http://dx.doi.org/10.1063/1.3581089View Description Hide Description
Cross-plane thermal diffusivity of a GaAs/AlGaAs-based vertical cavity surface emitting laser(VCSEL) is measured under operating conditions and active heat sinking using a thermoreflectance technique. Perpendicular thermal diffusivity is determined from the measurements of phase difference between the heating source and the temperature as a function of temperature modulation frequency. The value of (1.22 0.23) m2/s is obtained for thermal diffusivity, which is of the same order as previous values obtained on unbiased VCSEL structures. This is 10−14 times smaller than the corresponding bulk value. The reduction is attributed to the increase in phonon-boundary scattering in the multilayer structure of the VCSEL.
109(2011); http://dx.doi.org/10.1063/1.3582062View Description Hide Description
A nanoimprinting method was used to generate square imprints and arrays of imprints ranging in lateral dimension from 1 μm to 50 μm in p-type HgCdTe.Laser Beam Induced Current (LBIC) characterization shows electrical type conversion around each imprint and imprint array. The LBIC signal intensity surface maps of imprinted regions and their dependence with measurementtemperature correspond well with surface maps of n-on-pHgCdTephotodiodes formed by conventional techniques.