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In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films
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View: Figures


Image of FIG. 1.
FIG. 1.

LEED images of (a) the MgO(001) substrate and (b) the as-prepared film taken at 145 eV electron energy. Both the substrate and the film show clear peaks originating from a cubic unit cell (dashed squares). The spacing between the film diffraction peaks is reduced by a factor of two compared to the substrate peaks indicated a doubled real space lattice constant. Superstructure peaks are visible neither for the substrate nor the film.

Image of FIG. 2.
FIG. 2.

(Color online) Background corrected XPS measurement of the Fe2p region using a Shirley background. The Fe and Fe peak structure with satellites and shifted by 8 eV indicates complete stoichiometry.

Image of FIG. 3.
FIG. 3.

(Color online) Measured (open circles) and calculated (solid line) x-ray reflectivity intensity before the annealing experiment.

Image of FIG. 4.
FIG. 4.

(Color online) Measured (open circles) and calculated (solid line) XRD intensity before the annealing experiment (a) at and close to , i.e., the (002) B MgO reflection. In addition the figure shows the measured and calculated intensity at (b) and (c) where the phase transition to and are completed.

Image of FIG. 5.
FIG. 5.

(Color online) XRD measurements performed at different temperature steps during annealing.

Image of FIG. 6.
FIG. 6.

(Color online) Peak intensity of the first order fringe at as a function of temperature.

Image of FIG. 7.
FIG. 7.

(Color online) Vertical layer distance of the iron oxide film obtained by XRD corrected for thermal expansion. Blue circles represent the , green diamonds the , and red squares the FeO phase. In case that two phases are coexisting, the filled symbols represent the majority oxide phase dominating the diffraction pattern and the open symbols represent the minority phase. Dotted lines mark the bulk layer distance of , , FeO (2.166 Å), and MgO (2.106 Å).

Image of FIG. 8.
FIG. 8.

(Color online) Measured (open circles) and calculated (solid line) diffracted intensity around at . The dashed line marks the intensity originated from the majority phase and the dotted line the minority .


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films