XRD patterns of thin films. (a) Deoxidized thin films produced by pre-annealing. (b) Thin films further annealed at 723 K for 12 h in pure oxygen.
Variation of Tc of YBCO thin films with oxygen content. The oxygen content was estimated from the XRD peaks. These films were annealed at 723 K. The oxygen content depends on the annealing time.
Variation of the oxygen content with the annealing time for thin films annealed at different temperatures. The fit of the diffusion equation to the experimental data is shown by a solid line.
Arrhenius plot of the diffusion coefficient estimated from Fig. 3.
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