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Low energy Xe milling for the quantitative profiling of active dopants by off-axis electron holography
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10.1063/1.3625262
/content/aip/journal/jap/110/4/10.1063/1.3625262
http://aip.metastore.ingenta.com/content/aip/journal/jap/110/4/10.1063/1.3625262
/content/aip/journal/jap/110/4/10.1063/1.3625262
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/content/aip/journal/jap/110/4/10.1063/1.3625262
2011-08-31
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low energy Xe milling for the quantitative profiling of active dopants by off-axis electron holography
http://aip.metastore.ingenta.com/content/aip/journal/jap/110/4/10.1063/1.3625262
10.1063/1.3625262
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