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Influence of the surface structure and vibration mode on the resistivity of Cu films
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Image of FIG. 1.
FIG. 1.

(Color online) The atomic structure of Cu film consisting of two lead regions (denoted by L and R) and one scattering region (denoted by M). (a) For T = 0 K, no disorder in the scattering region; (b) For T ≠ 0 K, the atoms in scattering region violate the perfect crystal structure.

Image of FIG. 2.
FIG. 2.

(Color online) The temperature dependence of the resistivity. The theoretical results are shown by the solid circles, and the experimental ones by the solid squares.

Image of FIG. 3.
FIG. 3.

(Color online) The resistivities of Cu films with different thickness. The results for mode (i), mode (ii), and mode (iii) are represented by the solid circles, triangles, and squares, respectively.

Image of FIG. 4.
FIG. 4.

(Color online) The resistivity of Cu films as a function of thickness when the temperature is 520 K.


Generic image for table
Table I.

The theoretically estimated and experimentally measured values of the mean-square atomic vibration displacements for different temperatures T with θD  = 315 K.

Generic image for table
Table II.

The extra resistivity of Cu films due to surface electron-phonon scattering (defined by ρs  ≡ ρii  − ρiii ). The unit of ρs is µΩ cm.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of the surface structure and vibration mode on the resistivity of Cu films