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Abrupt suppression of the exchange bias across a non-magnetic insulator spacer
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Image of FIG. 1.
FIG. 1.

(Color online) Spacer thickness dependencies of as estimated by the FMR data fittings and those of and Hc extracted from the hysteresis loops of the annealed films; the error bars are smaller than the size of the symbols. Solid curve: exponential decay fit with decay length  = 0.7 ; dashed lines: guides to the eyes.

Image of FIG. 2.
FIG. 2.

Representative XRD spectra of as-deposited Ru/IrMn/Al2O3()/Co/Au films.

Image of FIG. 3.
FIG. 3.

(Color online) XRR spectra of the annealed Ru/IrMn/Al2O3()/Co/Au films (symbols); the solid lines are the corresponding fitting curves simulated using the Philips WINGIXA software package. Bottom: the respective data obtained on the Ru/IrMn/Cu(0.5 nm)/Co/Ru film.

Image of FIG. 4.
FIG. 4.

Cross-section transmission electron microscopy images of annealed IrMn(15 nm)/Al2O3(0.5 nm)/Co(7 nm), left, and IrMn(15 nm)/Cu(0.5 nm)/Co(5 nm), right, films.

Image of FIG. 5.
FIG. 5.

HRTEM images of annealed IrMn(/Cu(0.5 nm)/Co (top) and IrMn/Al2O3(0.5 nm)/Co (bottom) films.


Generic image for table
Table I.

Thickness/rms roughness values (both in nanometers), extracted from the fittings of the XRR scans given in Fig. 3 of the as-made Ru(15 nm)/IrMn(15 nm)/Al2O3()/Co(7 nm)/Au(10 nm) films.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Abrupt suppression of the exchange bias across a non-magnetic insulator spacer