(Color online) Spacer thickness dependencies of as estimated by the FMR data fittings and those of and Hc extracted from the hysteresis loops of the annealed films; the error bars are smaller than the size of the symbols. Solid curve: exponential decay fit with decay length = 0.7 ; dashed lines: guides to the eyes.
Representative XRD spectra of as-deposited Ru/IrMn/Al2O3()/Co/Au films.
(Color online) XRR spectra of the annealed Ru/IrMn/Al2O3()/Co/Au films (symbols); the solid lines are the corresponding fitting curves simulated using the Philips WINGIXA software package. Bottom: the respective data obtained on the Ru/IrMn/Cu(0.5 nm)/Co/Ru film.
Cross-section transmission electron microscopy images of annealed IrMn(15 nm)/Al2O3(0.5 nm)/Co(7 nm), left, and IrMn(15 nm)/Cu(0.5 nm)/Co(5 nm), right, films.
HRTEM images of annealed IrMn(/Cu(0.5 nm)/Co (top) and IrMn/Al2O3(0.5 nm)/Co (bottom) films.
Thickness/rms roughness values (both in nanometers), extracted from the fittings of the XRR scans given in Fig. 3 of the as-made Ru(15 nm)/IrMn(15 nm)/Al2O3()/Co(7 nm)/Au(10 nm) films.
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