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Elastic stiffness of single-crystalline FeSe measured by picosecond ultrasonics
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View: Figures


Image of FIG. 1.
FIG. 1.

The x-ray diffraction pattern of the FeSe thin film. The diffraction peaks contributed from the SrTiO3 substrate are starred.

Image of FIG. 2.
FIG. 2.

(Color online) The φ-scans of (101) and (221) peaks of the x-ray diffraction.

Image of FIG. 3.
FIG. 3.

(Color online) Magnetic susceptibility χ of the FeSe thin film measured under field cool (FC) and zero field cool (ZFC) conditions. The inset shows the magnified ZFC result, indicating the onset of superconductivity at ∼9.2 K.

Image of FIG. 4.
FIG. 4.

(Color online) Transient optical reflectivity changes of the FeSe thin film measured at 280 K (solid line). The carrier and thermal diffusion background signals are depicted by the dotted line. The inset shows the acoustic signals taken at different cryostat temperatures, which are vertically shifted for clarity (solid line). The oblique dotted lines mark the peak and/or dip positions of the echo signals, reflecting the advances of the echoes at lower temperatures.

Image of FIG. 5.
FIG. 5.

(Color online) Stiffness coefficient C 33 of the FeSe thin film at different temperatures. The line is the result of the best fit using Varshni’s formula.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Elastic stiffness of single-crystalline FeSe measured by picosecond ultrasonics