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Photoreflectance spectroscopy study of a strained-layer CdTe/ZnTe superlattice
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10.1063/1.3657785
/content/aip/journal/jap/110/9/10.1063/1.3657785
http://aip.metastore.ingenta.com/content/aip/journal/jap/110/9/10.1063/1.3657785

Figures

Image of FIG. 1.
FIG. 1.

XRD pattern of the SLS. The order of the superlattice peak is denoted by n.

Image of FIG. 2.
FIG. 2.

HR-TEM image of the SLS. CdTe and ZnTe sub-layers correspond to dark and bright layers, respectively.

Image of FIG. 3.
FIG. 3.

Potential barrier depth as a function of QC for all three energy bands of the SLS.

Image of FIG. 4.
FIG. 4.

PR spectrum of the SLS. Dashed and solid lines represent the experimental spectrum and the fit, respectively. The energies obtained are indicated by the arrows.

Image of FIG. 5.
FIG. 5.

Energies of the transitions determined by the envelope function approximation as a function of QC . Solid lines represent the calculated energy transitions. Dashed lines represent experimental values indicated by arrows in Fig. 4. Dotted line indicates the best fit between calculated and experimental values.

Tables

Generic image for table
Table I.

Values of the parameters used in strain effect calculations.

Generic image for table
Table II.

Experimental and calculated interband energies.

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/content/aip/journal/jap/110/9/10.1063/1.3657785
2011-11-02
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Photoreflectance spectroscopy study of a strained-layer CdTe/ZnTe superlattice
http://aip.metastore.ingenta.com/content/aip/journal/jap/110/9/10.1063/1.3657785
10.1063/1.3657785
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