1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
f
Erratum: “Stress determination in nickel monosilicide films using x-ray diffraction” [J. Appl. Phys.106, 073521 (2009)]
Rent:
Rent this article for
Access full text Article
/content/aip/journal/jap/110/9/10.1063/1.3660347
1.
1. D. Connetable and O. Thomas, Phys. Rev. B 79, 094101 (2009).
http://dx.doi.org/10.1103/PhysRevB.79.094101
2.
2. D. F. Wilson and O. B. Cavin, Scr. Metall. Mater. 26, 85 (1992).
http://dx.doi.org/10.1016/0956-716X(92)90374-N
3.
3. C. E. Murray, Z. Zhang, and C. Lavoie, J. Appl. Phys. 106, 073521 (2009).
http://dx.doi.org/10.1063/1.3236626
4.
journal-id:
http://aip.metastore.ingenta.com/content/aip/journal/jap/110/9/10.1063/1.3660347
Loading
/content/aip/journal/jap/110/9/10.1063/1.3660347
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/110/9/10.1063/1.3660347
2011-11-08
2014-07-23

Abstract

There is no abstract available for this article.

Loading

Full text loading...

/deliver/fulltext/aip/journal/jap/110/9/1.3660347.html;jsessionid=2csqqs94gdlkh.x-aip-live-06?itemId=/content/aip/journal/jap/110/9/10.1063/1.3660347&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/jap
true
true
This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Erratum: “Stress determination in nickel monosilicide films using x-ray diffraction” [J. Appl. Phys.106, 073521 (2009)]
http://aip.metastore.ingenta.com/content/aip/journal/jap/110/9/10.1063/1.3660347
10.1063/1.3660347
SEARCH_EXPAND_ITEM