Resonance spectrum of a specimen measured in a vacuum. Inset shows an enlarged resonance peak.
(Color online) Normalized contributions of Cij and eij to resonance frequencies.
(Color online) Comparison of computed (left) and measured (right) surface displacement distributions at two resonance frequencies.
Errors (%) in Cij and eij caused by the fluctuation of resonance frequency among three independent measurements Δf (0.06%) and measurement errors in mass density Δρ (0.09%) and dimension Δd (adding 1 μm in edge lengths, corresponding to volume change of 0.09%).
Elastic Cij (GPa), piezoelectric eij (C/m2), and anelastic (×10−5) coefficients of wurtzite GaN. The values in parentheses are calculation results. We determined the coefficients for two crystals whose carrier density was 2.2 × 1017 and 9.3 × 1017 cm−3. We define their average values as the coefficients of the wurtzite GaN.
Diagonal components of internal friction tensor of GaN, quartz, langasite, and TeO2 (×10−5).
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