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Robust unipolar resistive switching of Co nano-dots embedded ZrO2 thin film memories and their switching mechanism
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10.1063/1.3674322
/content/aip/journal/jap/111/1/10.1063/1.3674322
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/1/10.1063/1.3674322
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) (Color online) Typical URS I-V curve for the Co-E devices with 600 °C PA. (b) BRS behavior of the Ti/Co nano-dots embedded ZrO2/Pt devices. (c) BRS behavior of the Ti/Co-E ZrO2/Pt devices. (d) Negative bias set process for the Co-E devices with and without 600 °C PA.

Image of FIG. 2.
FIG. 2.

Endurance characteristics of the Ti/Co nano-dots embedded ZrO2/Pt devices with PA for URS operation.

Image of FIG. 3.
FIG. 3.

(a) Cross-sectional TEM image of the Ti/Co-E ZrO2/Pt devices without PA, and (b) the Ti/Co nano-dots embedded ZrO2/Pt device with 600 °C PA.

Image of FIG. 4.
FIG. 4.

(Color online) (a) The EDS spectrum of the embedded layer (Co) in the ZrO2 thin film in Fig. 3(a); (b) of the dark block (Co nano-dot) in Fig. 3(b), and (c) of the white region (via hole) in Fig. 3(b).

Image of FIG. 5.
FIG. 5.

(Color online) XPS depth profiling of Co-E devices (a) without PA, and (b) with 600 °C PA.

Image of FIG. 6.
FIG. 6.

(Color online) (a) The binding energy of Co in Co-E ZrO2 based devices with and without 600 °C PA. (b) The binding energy of Zr in Co-E ZrO2 based devices with and without PA.

Image of FIG. 7.
FIG. 7.

(Color online) Schematic descriptions of the conducting filaments formation and rupture by applying negative bias to set and reset the Ti/Co nano-dots embedded ZrO2/Pt devices with PA after forming process.

Image of FIG. 8.
FIG. 8.

Retention characteristics of HRS and LRS at 220 °C.

Image of FIG. 9.
FIG. 9.

Arrhenius plot and extrapolation for the retention time.

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/content/aip/journal/jap/111/1/10.1063/1.3674322
2012-01-05
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Robust unipolar resistive switching of Co nano-dots embedded ZrO2 thin film memories and their switching mechanism
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/1/10.1063/1.3674322
10.1063/1.3674322
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