XRD patterns of the Gax% samples (x = 0, 1.5, 3.0, 5.0, and 7.5) recorded at RT. For comparison, a simulated pattern of the L21-type structure is also added (a). The inserted figures show details around the main peak (220)—relative intensites are normalized in inset figures.
Low-field FC and FH magnetization curves as a function of temperature of the samples: Ga0%, Ga3.0%, Ga5.0%, and Ga7.5%.
Behavior of the thermal hysteresis (ΔT) in the Ga-doped Ni50n34.5In15.5 Heusler-type alloy (Gax% samples with x = 0, 1.5, 3.0, 5.0, and 7.5).
M(H)-isotherm curves recorded in the temperature range near the structural phase transition of Ga0% (a), Ga1.5% (b), Ga3.0% (c), Ga5.0% (d), and Ga7.5% (f) samples.
(a) Magnetic entropy change as a function of temperature [ΔSM(T, H = 5 T)] for the Ga0%, Ga1.5%, Ga3.0%, Ga5.0%, and Ga7.5% samples; (b) behavior of the ΔSM-peak values as a function of applied magnetic field.
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