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Dual roles of doping and trapping of semiconductor defect levels and their ramification to thin film photovoltaics
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10.1063/1.4719046
/content/aip/journal/jap/111/10/10.1063/1.4719046
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/10/10.1063/1.4719046
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

An acceptor level (concentration NA and TGFEL GA ) with EF GA ≫ 4 kT, doping efficacy ηd  = 100% (p = NA ) and trapping efficacy ηt  = 0; a donor level (concentration ND and TGFEL GD ) with EF GA  = 4 kT, doping efficacy ηd  < 2% (n < 2% ND ), and trapping efficacy ηt  > 98%. Note that the Hall effect and other experimental techniques measure GA for a p-type semiconductor and GD for an n-type semiconductor; neither EA and gA nor EA and gA are directly measurable.

Image of FIG. 2.
FIG. 2.

Case β = 1: Defect level’s trapping efficacy as function of V, x, and γ in the depletion region of a symmetric n-p junction.

Image of FIG. 3.
FIG. 3.

Case β ≫ 1: Defect level’s trapping efficacy as function of V, x, and γ in the depletion region of a symmetric n-p junction.

Image of FIG. 4.
FIG. 4.

Case β ≪ 1 (acceptor, double acceptor): Defect level’s trapping efficacy as function of V, x, and γ in the depletion region of a symmetric n-p junction.

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/content/aip/journal/jap/111/10/10.1063/1.4719046
2012-05-24
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dual roles of doping and trapping of semiconductor defect levels and their ramification to thin film photovoltaics
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/10/10.1063/1.4719046
10.1063/1.4719046
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