(a) Concentration dependences of the film’s effective magnetization obtained by the FMR and VSM techniques. (b) Typical FMR spectra for films with different cobalt contents. In all cases, the external magnetic field was applied perpendicularly to the film plane.
Cross-sectional TEM micrograph of the sample with x = 0.55. The inset shows a polar plot of the directional histogram for the TEM scan.
Temperature dependence of the coercivity measured along the normal to the film for the sample with x = 0.55. The inset shows the in-plane magnetization curve at RT.
MFM scans for the samples with: x = 0.49, x = 0.55, and x = 0.58 for the left, central, and right panes, respectively. The root mean square values of the phase shift for the scans are 0.32°, 0.17°, and 0.063°, respectively.
A typical 20 × 20 μm2 topographic image at 300 K (a) and the corresponding MFM patterns at different temperatures: (b) 300 K, (c) 350 K, (d) 420 K.
Magnetic contrast extracted from temperature dependent MFM images of the film with x = 0.55. The magnetic contrast is represented by the root mean square of the phase shift for the scanned image. A gradual disappearance of the magnetic contrast is observed as the magnetization decreases with the system approaching the phase transition.
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