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Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness
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10.1063/1.3679522
/content/aip/journal/jap/111/2/10.1063/1.3679522
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/2/10.1063/1.3679522
/content/aip/journal/jap/111/2/10.1063/1.3679522
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/content/aip/journal/jap/111/2/10.1063/1.3679522
2012-01-30
2014-08-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/2/10.1063/1.3679522
10.1063/1.3679522
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