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Femtosecond electron diffraction: Preparation and characterization of (110)-oriented bismuth films
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10.1063/1.3684975
/content/aip/journal/jap/111/4/10.1063/1.3684975
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/4/10.1063/1.3684975
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic of orientation of Bi (111) plane on sapphire (0001) plane, and (b) Bi (110) plane on KCl (100) plane.

Image of FIG. 2.
FIG. 2.

Typical XRD from the Bi/KCl sample.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Diffraction pattern from Bi (110) with FED measurements, and (b) computer simulated diffraction pattern from Bi (110). The diffraction indexes are inserted in the figure.

Image of FIG. 4.
FIG. 4.

(Color online) Kinetics of the electron diffraction from (−220) and (0-1-1) for an excitation fluence of ∼0.9 mJ/cm2. Open circles represent the experimental data and solid lines are the fitting function.

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/content/aip/journal/jap/111/4/10.1063/1.3684975
2012-02-16
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Femtosecond electron diffraction: Preparation and characterization of (110)-oriented bismuth films
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/4/10.1063/1.3684975
10.1063/1.3684975
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