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Structural studies of high-K u metastable CoPt thin films with long-range order
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10.1063/1.3670511
/content/aip/journal/jap/111/7/10.1063/1.3670511
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/7/10.1063/1.3670511
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) XRD θ−2θ patterns at χ = 0° (plane normal direction), 34.9°, and 55.1° of the 50 nm-thick CoPt thin films deposited on MgO(111) substrates at different temperatures.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Geometry of (10.1)hcp diffraction rod measurements. Plots of extended unit cell of (b) fcc-, (c) fct-, and (d) rhombohedral-centered hexagonal.

Image of FIG. 3.
FIG. 3.

(Color online) Diffraction profiles of l-scan for the 50 nm-thick CoPt thin films deposited at T a from RT to 700 °C.

Image of FIG. 4.
FIG. 4.

(Color online) Diffraction profiles of l-scan for the CoPt thin films deposited at 400 °C with thickness of 50, 20, and 10 nm.

Image of FIG. 5.
FIG. 5.

(Color online) In-plane and out-of-plane hysteresis loops for the CoPt thin films deposited at 400 °C with thickness of 50, 20, and 10 nm. The inset shows the in-plane hysteresis loop for the 50-nm-thick film measured by SQUID with maximum applied field of 5 T at 4 K.

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/content/aip/journal/jap/111/7/10.1063/1.3670511
2012-02-08
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural studies of high-Ku metastable CoPt thin films with long-range order
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/7/10.1063/1.3670511
10.1063/1.3670511
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