(Color online) Out of plane hysteresis loops of the (a) continuous films and (b) patterned films with different structures.
TEM cross-sectional images of patterned media with structure of (a) FePt(4 nm), (b) FePt(4 nm)/Fe(4 nm), and (c) FePt(4 nm)/Fe(6 nm). (d) SEM plan-view image of the FePt(4 nm)/Fe(6 nm) bit patterned sample. The pillar size is 31 nm with a distribution of 8%.
(Color online) (a) DCD curve obtained from MFM images of FePt(4 nm)/Fe(4 nm) ECC patterned sample and MFM images with different remanent states: after applied reverse field (b) −1 kOe, (c) −6 kOe, and (d) −9 kOe, respectively. The DCD curve was plotted by counting the number of the reversed magnetic islands under different remanent states from MFM images.
The dependences of thermal barrier and gain factor on the thickness of Fe layer. For the samples of FePt(4 nm), FePt(4 nm)/Fe(4 nm) and FePt(4 nm)/Fe(6 nm), the thermal barriers are 180 kBT, 210.5 kBT, and 192 kBT, respectively, and the gain factors are 1.1, 1.57, and 1.28, respectively.
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