(Color online) Cross-sectional TEM micrographs with magnification of × 500 K at the interface of CdTe and Cr2Te3 layer (a) and FFT images of Cr2Te3 layers (b). The d-space distances are indicated and the unit is Å.
(Color online) The M-H loops measured by SQUID along in-plane direction at 5 K under H FC = 1 T (FC) and H FC = 0 T (ZFC).
(Color online) The temperature dependence of HE and HC . The inset shows the M-H loop measured at 110 K with H FC = 1 T.
(Color online) The measure field dependence of HE and HC .
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