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Investigation on the antiferromagnetic component in the intrinsic exchange bias in structurally single phase Cr2Te3 thin film
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10.1063/1.3677883
/content/aip/journal/jap/111/7/10.1063/1.3677883
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/7/10.1063/1.3677883
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) Cross-sectional TEM micrographs with magnification of × 500 K at the interface of CdTe and Cr2Te3 layer (a) and FFT images of Cr2Te3 layers (b). The d-space distances are indicated and the unit is Å.

Image of FIG. 2.
FIG. 2.

(Color online) The M-H loops measured by SQUID along in-plane direction at 5 K under H FC = 1 T (FC) and H FC = 0 T (ZFC).

Image of FIG. 3.
FIG. 3.

(Color online) The temperature dependence of HE and HC . The inset shows the M-H loop measured at 110 K with H FC = 1 T.

Image of FIG. 4.
FIG. 4.

(Color online) The measure field dependence of HE and HC .

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/content/aip/journal/jap/111/7/10.1063/1.3677883
2012-03-08
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Investigation on the antiferromagnetic component in the intrinsic exchange bias in structurally single phase Cr2Te3 thin film
http://aip.metastore.ingenta.com/content/aip/journal/jap/111/7/10.1063/1.3677883
10.1063/1.3677883
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