X-ray diffraction pattern recorded in θ-2θ geometry of the (a) CaCuTi4O12 on LaAlO3 (b) NiFe2O4 on LaAlO3 (c) composite Film [CaCuTi4O12 (70%)-NiFe2O4(30%)] grown on LaAlO3 substrate and (d) same films with a bottom layer of SrRuO3.
(a) Schematic of vertical self-assembled nanostructure of [CaCuTi4O12 (70%)-NiFe2O4(30%)] grown on the LaAlO3 substrate with a bottom layer of SrRuO3. (b) AFM image of composite film and (c, d) FESEM images of composite film at two different magnifications.
Room temperature Raman spectra of pure CaCu3Ti4O12, pure NiFe2O4, and composite CaCuTi4O12-NiFe2O4 film grown on the LaAlO3 substrate.
Temperature dependence of the dielectric constant of the CCTO-NFO composite film at 1 kHz. Inset shows the schematic of the experimental arrangement used for dielectric measurements.
In-plane (closed circles) and out-of-plane (open circles) magnetization vs magnetic field (M-H) hysteresis loops at 100 K for pure NFO film (a) and CCTO-NFO composite film at 100 K (b).
Zero field cooled magnetization vs temperature curve measured at H = 500 Oe for the CCTO-NFO composite film (a) and pure NFO film (b) and field cooled curve for the CCTO-NFO composite film (c).
Out-of-plane lattice parameters calculated from the X-ray diffraction pattern for bulk and thin films of the parent CaCu3Ti4O12, NiFe2O4 and composite (CCTO-NFO).
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