Cross-sectional view of substrate sliced parallel to growth direction.
EBIC image at crystalline defects in region I.
(a) SEM image of precipitation in region I and atomic distributions of (b) Si, (c) C, and (d) N.
(a) EBIC image at the precipitates observed in region III, (b) high resolution SEM image, and atomic distributions of (c) Si, (d) C, and (e) N.
(a) EBIC image and (b) EBSD diagram at small-angle grain boundaries in region IV.
(a) SEM image of precipitates at small-angle grain boundaries and atomic distributions of (b) Si, (c) C, and (d) N.
Article metrics loading...
Full text loading...