XRD scan of rice husk treated at 1900 °C in air showing the cristabolite phase of SiO2.
XRD scan of rice husk treated at 1900 °C in vacuum showing the β-SiC phase.
TEM micrograph of SiC samples obtained after microwave processing them at 1900 °C in vacuum. SiC powder particles get sintered to one another. Their sizes vary between 100 and 300 nm in diameter.
(a) Particle showing stacking faults. (b) The corresponding diffraction pattern in the  zone. (c) Diffraction pattern from another particle showing twined spots close to  zone.
Raman scattering data of microwave processed rice husk sample at 1900 °C in vacuum showing the TO and LO lines of β-SiC and D and G lines of graphitic-like material.
(a) FTIR reflection spectra collected from two different regions within the sample, and (b) zoomed in view of the spectra within 650–1250 cm−1 spectral range.
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