X-ray diffraction patterns for all samples. The inset shows the diffraction peaks of the (110) plane for STO-Zn at x = 0%, 0.3%, 0.6%, and x = 0.9% from bottom to top, respectively.
(a) Evaluated lattice parameter, (b) dielectric constant ɛ at 10 K under frequency of 10 kHz, and (c) Barrett equation parameter (T 1 − 2T 0) as a function of Zn content x.
Measured T-dependence of dielectric constant ɛ at 10 kHz for all samples. The T axis is in log-scale.
(a) Calculated ɛ(T) data from transverse-field Ising model. (b) Calculated ɛ(x) at T = 10 K.
Parameters chosen for transverse-field Ising model.
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